Charging characteristics of Sb nanocrystals embedded in copper phthalocyanine films for memory applications
The charging characteristics of Sb nanocrystals embedded in organic semiconductor copper phthalocyanine (CuPc) have been studied for the first time. The images from atomic force microscopy show that Sb NCs grown on the surface of CuPc film exhibit a vertical height of 10-15 nm and uniform distribution, which are interspersed with a few bigger ones (~30 nm). Two kinds of capacitancevoltage measurements, frequericy responds and hysteresis loops, of the control sample and the one embedded with Sb NCs indicate the charging and discharging of the Sb NCs.
Yue Huang Shi-Jin Ding Dietrich R.T. Zahn
State Key Laboratory of ASIC and System, Department of Microelectronics, Fudan University, Shanghai Semiconductor Physics, Chemnitz University of Technology, Chemnitz 097107, Germany
国际会议
上海
英文
1289-1291
2010-11-01(万方平台首次上网日期,不代表论文的发表时间)