Detecting the Interface State of Organic Thin-film Transistors Through Hysteresis Characteristics

摘要：

Under white-light irradiation, thin film transistors based on copper phthalocyanine (CuPc) exhibited obvious hysteresis effects when applying bidirectional sweeping gate voltage, the hysteresis window comes up to 32 V. This hysteresis effect is the result of those accumulated photogenerated carriers trapped in the interface, which proposed a feasible way to detect the state of the interface between organic functional materials and the dielectric layer.

作者: Zhuoyu Ji Lijuan Zhen Liwei Shang Ming Liu Hong Wang Xin Liu Maixing Han

作者单位: Lab of Nano-fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China, 100029

会议类型: 国际会议

会议名称: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

会议地点: 上海

会议语种:英文

页码: 1295-1297

在线出版日期: 2010-11-01（万方平台首次上网日期，不代表论文的发表时间）