A High-Accuracy Temperature Sensor With An Inaccuracy of ±1 C From-55C to 125 C
A smart temperature sensor based on 0.35um ASMC CMOS process with an inaccuracy of ±1℃ from -55℃ to 125 ℃ is presented. The sensor uses substrate vertical bipolar transistor to measure the temperature and errors resulting from nonidealities in the readout circuit are reduced to 0.1℃ level by applying dynamic element matching (DEM) and chopping offset cancellation techniques. By using pseudo-random sequence, the mismatch of current mirrors can be reduced to smaller comparing with other methods. A voltage proportional to absolute temperature added to base-emitter voltage is used to compensate the process spread at one temperature with the trade off between inaccuracy and complexity. A digital output is realized by an on-chip sigma-delta ADC which is compatible with digital bus interface.
dynamic element matching offset cancellation calibration temperature sensor smart sensor pseudo-random sequence.
Jianguang Chen Shaolong Liu Yuhua Cheng
Shanghai Research Institute of Microelectronics, Peking University, China
国际会议
上海
英文
1444-1446
2010-11-01（万方平台首次上网日期，不代表论文的发表时间）