Recent Progress in Testing, Characterization and Protection for CDM ESD Events

摘要：

This paper reviews the progress in testing standards, characterization methods as well as protection techniques against the Charge Device Model (CDM) ESD event. The paper also discusses recent development trends in this field.

作者: Yuanzhong Zhou Alan W. Righter Jean-Jacques Hajjar

作者单位: Analog Devices, 804 Woburn St., Wilmington, MA 01887, USA

会议类型: 国际会议

会议名称: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

会议地点: 上海

会议语种:英文

页码: 1604-1607

在线出版日期: 2010-11-01（万方平台首次上网日期，不代表论文的发表时间）