A capacitance coupling complementation SCR for on-chip electrostatic discharge protection
A capacitance coupling complementation silicon controlled rectifies (CCCSCR) for electrostatic discharge (ESD) protection application is proposed and verified in 0.5μm BCD process. Compared with traditional complementation silicon controlled rectifies (CSCR), the CCCSCR has a lower trigger voltage. The coupling capacitance, as a tunable trigger of SCR, can meet different protection application demands. And the CCCSCR can fulfill all dual direction ESD stress mode protection, including I/O-VSS, I/O-VDD and VDD-VSS.
Capacitance coupling CSCR ESD trigger voltage
Mingliang Li Shurong Dong Meng Miao Bo Song Fei Ma Yan Han
ESD Lab, Dept. of ISEE, Zhejiang University, Hangzhou, 310027, China ESD Lab, Dept. of ISEE, Zhejiang University,Hangzhou, 310027, China
国际会议
上海
英文
1633-1635
2010-11-01(万方平台首次上网日期,不代表论文的发表时间)