会议专题

A capacitance coupling complementation SCR for on-chip electrostatic discharge protection

A capacitance coupling complementation silicon controlled rectifies (CCCSCR) for electrostatic discharge (ESD) protection application is proposed and verified in 0.5μm BCD process. Compared with traditional complementation silicon controlled rectifies (CSCR), the CCCSCR has a lower trigger voltage. The coupling capacitance, as a tunable trigger of SCR, can meet different protection application demands. And the CCCSCR can fulfill all dual direction ESD stress mode protection, including I/O-VSS, I/O-VDD and VDD-VSS.

Capacitance coupling CSCR ESD trigger voltage

Mingliang Li Shurong Dong Meng Miao Bo Song Fei Ma Yan Han

ESD Lab, Dept. of ISEE, Zhejiang University, Hangzhou, 310027, China ESD Lab, Dept. of ISEE, Zhejiang University,Hangzhou, 310027, China

国际会议

2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

上海

英文

1633-1635

2010-11-01(万方平台首次上网日期,不代表论文的发表时间)