Optimization of Step Stress Accelerated Degradation Test Plans
In the reliability prediction of the product with long life and high reliability, the step stress accelerated degradation test (SSADT) is commonly applied. With the motivation of predicting the product reliability most precisely, the problem of optimizing the test plans has drawn a lot of attentions in the application of SSADT. In this paper, the drift Brownian motion is selected as the degradation model. And in order to minimize the mean square error (MSE) of the prediction of the product operation reliability, the test plans of a SSADT that under the specified total test time and sample size are optimized through a Monte Carlo simulation method. At last, in combination with the sensitive analysis, the robust optimal test plans are obtained.
Accelerated degradation test step stress optimal design simulation sensitive analysis
Jing-Rui ZHANG Tong-Min JIANG Xiao-Yang LI Li-Zhi WANG
School of Reliability and System Engineering,Beihang University,Beijing,China
国际会议
厦门
英文
947-951
2010-10-29(万方平台首次上网日期,不代表论文的发表时间)