Total Least Squares Method for Sine Fitting

摘要：

Sine fitting is a fundamental task in many test and measurement systems. Total Least Squares (TLS) is an extension of the usual least squares method: it allows dealing also with uncertainties on the sensitivity matrix. A sine fitting algorithm based on TLS are employed to filter the sampled sequences of sine signals, eliminating ill effects on the measurement accu-racy caused by noises (including the harmonic distortion and quantization error). Experiments show that the given noised sine signals can be estimated accurately after uniform sampling, and the sampling time should be considered carefully.

关键词： Sine fitting Total least squares SVD decomposition Quantization error Sampling time

作者: WANG Xin XU Yuanyuan

作者单位: Institute of Measurement and Process ControlJiangnan UniversityWuxi, China Institute of Measurement and Process Control Jiangnan University Wuxi, China

会议类型: 国际会议

会议名称: 2010 3rd International Conference on Advanced Computer Theory and Engineering(2010年第三届先进计算机理论与工程国际会议 ICACTE 2010)

会议地点: 成都

会议语种:英文

页码: 1-4

在线出版日期: 2010-08-20（万方平台首次上网日期，不代表论文的发表时间）