A Practical Noise Parameter Measurement Method of Packaged Low Noise Transistor

摘要：

The key issue of packaged Low noise transistor noise parameter characterization is test fixture, this paper describes how to design test fixture and TRL cal standard based on PCB in detail, and also comprehensive verification of test fixture and TRL cal standard in frequency domain and time domain. Whats more, this paper takes advantage of a new ultra-fast noise parameter measurement method with more simplicity, less test time and also more measurement accuracy.

关键词： Noise Parameter Noise Figure Low Noise Transistor Vector Network Analyzer TRL

作者: Di Liu Wei Zhou Yudong Wang Jun Fu Gaoqing Li Jie Cui

作者单位: Agilent Technologies, Beijing, 100102, P.R.C Institute of Microelectronics of Tsinghua University, Beijing, 10084, P.R.C

会议类型: 国际会议

会议名称: 2010 International Conference on Microwave and Millimeter Wave Technology(2010国际微波与毫米波技术会议 ICMMT2010)

会议地点: 成都

会议语种:英文

页码: 910-913

在线出版日期: 2010-05-08（万方平台首次上网日期，不代表论文的发表时间）