Study of Nonlinear Modeling for Microwave Diode based Measurement

摘要：

Nonlinear modeling of microwave diode is discussed in this paper. A measurement system is set up based on the conception of nonlinear scattering functions and the principle of measuring is introduced. A microwave schottky diodes partial scattering functions is extracted and compared with the simulated results in Serenade and results agree well. Nonlinear scattering functions can be used as a new tool to character nonlinear microwave device and our system can extract scattering functions accurately.

关键词： Nonlinear Scattering Functions modeling Schottky diode set-up

作者: Anhui Liang Yanfeng Xu Guoquan Sun

作者单位: National Key Laboratory of Science and Technology on Electronic Test and Measurement No. 98 Xiangjiang Rd, Qingdao Economy and Technology Development Zone Shandong Province, 266555 China

会议类型: 国际会议

会议名称: 2010 International Conference on Microwave and Millimeter Wave Technology(2010国际微波与毫米波技术会议 ICMMT2010)

会议地点: 成都

会议语种:英文

页码: 1080-1082

在线出版日期: 2010-05-08（万方平台首次上网日期，不代表论文的发表时间）