Research and Simulation Test Base on LFSR Reseeding Test Compression Technology

摘要：

Considering from test time, test power and access, this article adopts new method that LFSR reseeding based on syncopation of some test patterns. In a test set, some patterns have a lot of eonftrmed bits and are hardly encoded by LFSR.They are syncopated and substituted by generating patterns .This method can reduce the number of seeds and improve the utilization of seed so that achieve the purpose of test data compression. Using in the benchmark circuits, experimental results show that it can better improve the compression rate and reduce the cost of test.

关键词： LFSR Reseeding Confirmed Bits Test Data Compression Test Benchmark Circuits

作者: Jing Gu YI Lin Xiaoyang Yu

作者单位: School of Computer Science and Technology, Harbin University of Science and Technology Harbin, China School of Measurement & Control Technology and Communication Engineering Harbin University of Scienc

会议类型: 国际会议

会议名称: The 4th International Symposium on Computational Intelligence and Industrial Application(第四届国际计算智能和工业应用研讨会)

会议地点: 哈尔滨

会议语种:英文

页码: 168-173

在线出版日期: 2010-08-01（万方平台首次上网日期，不代表论文的发表时间）