Challenges in Reliability Assessment for Electronics

摘要：

There has been a growing interest in assessing the ongoing reliability of electronics and systems in order to predict failures and provide warning to avoid catastrophic failure. Methods based on prognostics and health management shows an enabling technology to assess the reliability of electronics and systems under its actual application conditions. However, many challenges in implementation of methods based on PHM still remain including: environmental and usage profiles for life-cycle loads, identification of failure mechanism, identification of failure PoF model, identification of parameters to be monitored, approaches to anomaly detection. These challenges were presented and discussed, and would be carried out by developing methodologies and techniques.

关键词： Reliability assessment Prognostics and health management (PHM) Electronics Systems FMMEA

作者: Qingchuan HE Wenhua CHEN Jun PAN Shijiao WANG

作者单位: Institute of Mechanical Design & Manufacture, Zhejiang Sci-Tech University,Hangzhou 310018, China Institute of Mechanical Design & Manufacture, Zhejiang Sci-Tech University, Hangzhou 310018, China

会议类型: 国际会议

会议名称: The 2nd International Conference on Advances in Product Development and Reliability(第二届产品开发与可靠性进展国际会议 PDR2010)

会议地点: 沈阳

会议语种:英文

页码: 419-423

在线出版日期: 2010-07-28（万方平台首次上网日期，不代表论文的发表时间）