Ultra-High Temperature Ablation Image Acquisition and Analysis System based on CCD
A system, which can capture the real time image of ablative surface under strong stray light environments caused by plasma arc, has been presented. The system has been under nearly one year of service in some national key laboratory. It has been shown that the system can effectively shield the influence of plasma jet and stray light with the temperature over 4,000 K and in the meanwhile, high quality image (with the resolution of 0.01 mm) of ablative surface (with the temperature of 3, 000 K) can be obtained. The image acquisition system provided in the present paper can not only be applied to plasma jet on-line monitoring, but also be used in other areas which require real-time monitoring under strong stray light environments.
CCD Image acquisition Image analysis
Zhiwen Wang Xiuyan Peng
College of Automation Harbin Engineering University Harbin,150001,P.R. China
国际会议
2010 IEEE信息与自动化国际会议(ICIA 2010)
哈尔滨
英文
1-4
2010-06-20（万方平台首次上网日期，不代表论文的发表时间）