Digraph Theory Based System Testability Analysis

摘要：

The incorporation of adequate testability, including built-in test (BIT), requires early and systematic management attention to testability requirements, design and measurement. The paper prescribes a systematic approach to establishing and conducting testability analysis on basis of digraph theory incorporating set theory, predicate calculus, matrix theory and artificial intelligence. Methods for testability modeling, knowledge compilation and system optimization are all introduced in the paper. The theory in the paper is applicable to the development of all types of electronic components, equipments, and systems.

关键词： testability analysis digraph theory testability modeling algorithms

作者: Wang Baolong Huang Kaoli Ma Liyuan Xu Jianfen

作者单位: Ordnance Engineering College,Shijiazhuang 050003 China Beijing Aerospace Control Center,Beijing 1000 Ordnance Engineering College,Shijiazhuang 050003 China Beijing Aerospace Control Center,Beijing 100094 China

会议类型: 国际会议

会议名称: The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

会议地点: 厦门

会议语种:英文

页码: 209-212

在线出版日期: 2010-05-22（万方平台首次上网日期，不代表论文的发表时间）