Comprehensive Self-Test Plan for ATS

摘要：

It has more difficulty in self-test of the whole integrated Automatic Test System (ATS) because there are many kinds of instruments and switches. A comprehensive self-test plan is presented through analyzing general ATS self-test methods based on the instrument built-in-test, instrument comparison and switching. The plan can be divided into four steps including built-in-test of the instruments, test of the key instruments, test of the switches and the instrument comparison. It can reliably test the availability of the general parts of ATS.

关键词： automatic testing Automatic Test System (ATS) self-test

作者: Wang Changjin Wang Fengqin Cong Linhu

作者单位: Department of Ordnance Science and Technology,Naval Aeronautical and Astronautical University,Yantai 264001 China

会议类型: 国际会议

会议名称: The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

会议地点: 厦门

会议语种:英文

页码: 278-282

在线出版日期: 2010-05-22（万方平台首次上网日期，不代表论文的发表时间）