Novel Fault Diagnosis Method for Non-linear Circuit Based on Node-voltage Sensitivity Sequences

摘要：

The fault diagnosis strategy based on node - voltage sensitivity sequence is extended into the non-linear circuits. Firstly the piece-wise linearization model of non-linear devices VCR and the feasible operation field of multi-non-linear device are presented. Secondly, the fluctuation of node-voltage is ranged according to the sensitivity analysis of fault-free circuit Finally, the fault dictionary based on node - voltage sensitivity sequence is established. The theory analysis and the experimental results show that the method is feasible and provides a new strategy to test and fault diagnosis of non-linear circuits.

关键词： Non-linear circuit fault diagnosis node-voltage sensitivity

作者: Cheng Shengjian Xu Lei Wang Mengmeng Wang Yuefang

作者单位: Academy of Armored Force Engineering,Beijing 100072 China

会议类型: 国际会议

会议名称: The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

会议地点: 厦门

会议语种:英文

页码: 359-363

在线出版日期: 2010-05-22（万方平台首次上网日期，不代表论文的发表时间）