Testing Instrument for Highway Rut with High Efficiency based on MSP430F149 MCU
With the development of highway in China, more and more drivers and passengers focus on some important factors of highway, including quality, safety, comfort, and so on. It is rut of highway that greatly affects the above factors. The testing instrument for highway rut based on MSP430F149 MCU can measure max rut height and unbiased variance of highway with higher efficiency than the traditional way. The state of highways rough surface can be got by MCU from output voltage of laser-angle sensor, from which the highway rut can be calculated by geometry processing with sin function. The instrument has many advantages, such as high precision, small volume, convenient move, low-power consume and multifunction.
Rut Highway Angle Sensor Unbiased variance
Lv Zhigang Wang Peng Liu Cuixia Fan Xiaoguang
Electronic Information College,Xian Technological University,Xian 710032,China School of Materials and Chemical Engineering,Xian Technological University,Xian 710032,China Foreign Language College,Qingdao Technological University,Qingdao 266033,China
国际会议
厦门
英文
606-609
2010-05-22（万方平台首次上网日期，不代表论文的发表时间）