Novel Method for Screening Reliability of OCDs Based on Standard Deviation Analysis of Noise Spectrum
Because of the limitation of the use of the noise parameters at some fixed frequency-points to represent the reliability of the OCDs, a novel method for screening reliability of OCDs which is based on the standard deviations of the noise spectrum is presented in the paper. Firstly, the paper introduces the sources of the excess noise in OCDs and explains why low-frequency noise can be used to screen devices reliability. Then the process how to screen the reliability of OCDs is described in details, including the calculation of the mean and the standard deviation of the noise voltage amplitudes and determination of the coefficients of the upper and lower limits of the noise spectrum. Compared with the previous screening method, it analyzes the noise spectrum in a wide frequency band and can gain more information about the defect of the devices. The experimental results demonstrated that this method is reliable, simple but precise.
OCD low-frequency noise reliability noise spectrum
Zhou Qiuzhan Wu Dane Gao Jian Ibrahima Diagne
College of Communication Engineering,Jilin University,Changchun 130025 China Virginia Polytechnic Institute and State University,U.S.A
国际会议
厦门
英文
705-708
2010-05-22（万方平台首次上网日期，不代表论文的发表时间）