Supply Current Sensor Structure for Testing Σ-Δ Modulators

摘要：

A novel built-in supply current sensor structure for testing the Σ-Δ modulators is presented in this paper. The dynamic supply currents in modulators unit are captured via scanning in testing mode and analyzed to detect defects. The testing structure has only one current sensor and can readily be expanded for using in other mixed-signal circuits. Simulation results show that the good performances of the testing solution.

关键词： mixed-signal circuit supply current sensor testing Σ -Δ modulators

作者: Tang Shengxue Chen Li He Yigang

作者单位: Hebei University of Technology,Tianjin 300130,China College of Electrical and Information Engineering,Hunan University,Changsha 410082,China

会议类型: 国际会议

会议名称: The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

会议地点: 厦门

会议语种:英文

页码: 944-948

在线出版日期: 2010-05-22（万方平台首次上网日期，不代表论文的发表时间）