Development of Circuit Tester of VLSIC

摘要：

Based on the boundary scan technology and the virtual instrument technology, a circuit tester of VLSIC with boundary scan test function and analog waveform and digital waveform test function is developed in this paper. A new JTAG data fast loading method is proposed, and a two channel JTAG data loading circuit is designed based on USB interface, which is composed of a data communication circuit and a test data fast loading circuit centered on CPLD. A diagnostic software of boundary scan test with the scan link integrity test function and the interlinkage net test function is also developed in the paper. The test experiment is done and good test effectiveness is obtained.

关键词： Boundary scan virtual instrument VLSIC test

作者: Bi Zengjun

作者单位: Airforce Radar Academy,Wuhan 430019 China

会议类型: 国际会议

会议名称: The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

会议地点: 厦门

会议语种:英文

页码: 961-964

在线出版日期: 2010-05-22（万方平台首次上网日期，不代表论文的发表时间）