会议专题

Analytical Model For The Size Effect On The Micro-beam Deformation in MEMS

A static deformation model for analyzing the microbeam is presented based on the size effect on the mechanical behavior which is result of the micro-beam contour size in microns. Compare the finite element simulation results with those of analytical modeling, and it is found that both results are consistent when the driving voltage reaches 84%of the threshold voltage. The main conclusions show that the effective modulus of elasticity and the deflection of the micro-beam will reveal significant size effect when micro-beam contour size decreases to a value which is comparable to the material length scale parameter, as well as, the deformation deflection will jump when the driving voltage reaches a certain value.

Micro-beam size-effect analytical model

Chen Meiqin Su Jilong

The College Of Mechanical and Electrical Engineering,Fujian Agriculture and Forestry University,Fuzhou350002 China

国际会议

The Third International Symposium on Test Automation & Instrumentation(第三届国际自动化测试与仪器仪表学术会议 2010 ISTAI)

厦门

英文

1159-1163

2010-05-22(万方平台首次上网日期,不代表论文的发表时间)