Combining Method of Analog Multi-fault Diagnosis Based on Temperature and Voltage
With the development of electronic technology, analog circuit becomes more and more complex. Voltage test is good at single-fault diagnosis, but it tends to be weak at multi-fault. This paper gives a combining method which diagnoses multi-fault circuits as well as single-fault ones by temperature and voltage both. Because the result is determined by two different ways: one is contacting way; the other is not, they can get a more detail and overall detection of circuits. The experiment shows an increase on fault resolution and fault coverage.
Analog Circuit Multi-fault Diagnosis Combining Method Temperature and Voltage Pattern
Hao Yanhong Wang Jiali
School of Electromechanical Engineering,Xidian University,Xian,710071,China
国际会议
厦门
英文
1279-1283
2010-05-22（万方平台首次上网日期，不代表论文的发表时间）