MOP-DDPG:Multiple Observation Points Oriented Deterministic Diagnostic Pattern Generation for Compound Faults

摘要：

Scan-based design is a widely used Design-for-Testability (DFT) technique to improve test and diagnosis quality. As scan chains and relative control logic can take up as much as 40％ of transistors in logic part, defects are prone to impact both scan chains and system logic simultaneously. When these defects manifested as scan chain faults and system logic faults, we call such faults as compound faults. In this paper, we present a Multiple Observation Points Oriented Deterministic Diagnostic Pattern Generation (MOP-DDPG) technique that targets compound faults. We further propose a fault suspect analysis technique to find root cause of the faults either on scan chains or on system logic or both. Experimental results show that on average scale, MOP-DDPG can accurately locate a dozen of compound faults.

作者: Fei Wang Yu Hu Jing Ye Yu Huang Xiaowei Li Haigang Yang

作者单位: System on Programmable Chip Research Department, Institute of Electronics, Chinese Academy of Scienc Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Acade Mentor Graphics Corporation, 300 Nickerson Rd., Marlborough, MA, 01752, USA

会议类型: 国际会议

会议名称: China Semiconductor Technology International Conference 2010(中国国际半导体技术大会 CSTIC)

会议地点: 上海

会议语种:英文

页码: 179-184

在线出版日期: 2010-03-18（万方平台首次上网日期，不代表论文的发表时间）