Steganalysis Based on Regression Model and Bayesion Network
In this paper, we propose a feature generation and classification approach for universal steganalysis based on Genetic Algorithm (GA) and higher order statistics. The GA is utilized to select a subset of candidate features, a subset of candidate transformations to generate new features. The Logistic Regression Model and Bayesion Network Model are then used as the classifier. Experimental results show that the GA based approach increases the blind detection accuracy and also provides a good generality by identifying an untrained stego-algorithm.
Steganalysis Genetic Algorithm
Xiao Yi Yu Aiming Wang
Scool of Computerv and Information Engineering Anyang Normal University, Henan, China Computer Depar Scool of Computerv and Information Engineering Anyang Normal University Henan, China
国际会议
武汉
英文
41-44
2009-11-18(万方平台首次上网日期,不代表论文的发表时间)