Study of photoluminescence properties of Nd-O+-codoped Si-based thin film
The photoluminescence(PL) spectra at room temperature for the Si-based samples doped by Nd 、 O+ are measured.All the samples possess blue-violet PL properties and light emission is stable.The PL spectra has multiple peak structure.The intensity of PL spectra is relative to Nd and O+ implantation and the annealing temperature.The light emission is more greater for the sample of first O+ then Nd ion-implanted silicon than the one of first Nd then O+ ion-implanted silicon.
(250.5230) General (160.4760) General
YUAN Meiling LI Chenfa LENG Xinli
Department of Phisics,Nanchang University,Nan chang Jiangxi,33031, China
国际会议
上海
英文
1-2
2009-11-01(万方平台首次上网日期,不代表论文的发表时间)