会议专题

Design Methodology of a Fault Aware Controller Using an Incipient Fault Diagonizer

The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent requirement of quality of a product needs considerable attention in the performance and reliability of the manufacturing system. In general, the feedback control algorithm for a process designed to handle small perturbation that may arise under normal operating condition but can not accommodate any abnormal behavior due to fault. Thus the automated maintenance or early detection of worn equipment is becoming a critical issue. This justifies the need of development of effective methodology in the area of fault aware controller. In this paper we proposed a novel Algorithm and it have been tested and implemented for making Highly reliable system like Automated Cricket Ball Stitching Machine. Considering this need the present paper proposes the work on the development methodology of fault aware controller using embedded processor with reference to an early needle failure detection of a leather stitching machine.

Joydeb Roychoudhury Tribeni P. Banrerjee Anup K. Bandopadhaya Ajith Abraham

Central Mechanical Engineering Research Institute, Embedded system Laboratory, Durgapur-713209 Electronics and Telecommunication Engineering Department, NIT Durgapur Durgapur-71320 Machine Intelligence Research Labs, Scientific Network for Innovation and Research Excellence, USA

国际会议

2009 Ninth International Conference on Hybrid Intelligent Systems(第九届混合智能系统国际会议 HIS 2009)

沈阳

英文

1-5

2009-08-12(万方平台首次上网日期,不代表论文的发表时间)