Growth of ZnO films under different oxygen partial pressures by metal organic chemical vapour deposition
ZnO films were grown under different oxygen partial pressures by metal organic chemical vapor deposition on the substrates of Coming glass. We investigated the quality of the films by SIEMENS D8 X-ray diffractometer. The surface morphology of the films were observed by Digital Nanoscope шa AFM with normal silicon nitride tip in the contact mode. The hall effect measurements were carried out with indium ohmic contact. The transmission spectrum of the films were measured. The transmission ratio is larger than 80% in the region above the wavelength of 385nm, and sharply decreased under 10% below the wavelength of 375 nm.
Ba ZnO Thin Films Growth Glass MOCVD
C. Wang J. Sun G. Du X. Yang B. Liu C. Zhao W. Tang J.Yang X.Gao H. Liang J. Zhao
Jilin Institute of Architecture and Civil Engineering, Hongqi Street 1129#, Changchun City, Jilin Pr Dalian University of Technology, China Jilin Institute of Architecture and Civil Engineering, Hongqi Street 1129#, Changchun City, Jilin Pr Northwestern University, USA
国际会议
2009 International Symposium on Liquid Crystal Science and Technology(2009国际液晶科技研讨会)
昆明
英文
458-461
2009-08-02(万方平台首次上网日期,不代表论文的发表时间)