Vision Feedback for Automated Nanohandling

摘要：

The handling of nanoscale objects is a field with high prospects and good perspectives. This paper presents different necessary image processing methods and algorithms, which are needed to enable the reliable automation of nanohandling processes. The imaging sensor used to gain access to the nanoscale world is the scanning electron microscope (SEM). Tasks to be fulfilled on image data from the SEM include object recognition, object tracking and depth estimation. All these algorithms are discussed and validated.

作者: Sergej Fatikow Christian Dahmen Tim Wortmann Robert Tunnell

作者单位: Division of Microrobotics and Control Engineering,University of Oldenburg,Oldenburg,Germany OFFIS e.V.,Oldenburg,Germany

会议类型: 国际会议

会议名称: 2009 IEEE International Conference on Information and Automation(2009年 IEEE信息与自动化国际学术会议)

会议地点: 珠海、澳门

会议语种:英文

页码: 806-811

在线出版日期: 2009-06-22（万方平台首次上网日期，不代表论文的发表时间）