会议专题

Research and Realization of Digital Circuit Fault Probe Location Process

This paper presents three core files relating to circuit fault diagnosis which is generated by LASAR(Logic Automated Stimulus Response), i.e. fault dictionary, node truth table and pin connection table, analyses the content of fault dictionary, pin connection table and node truth table, finds the necessary information for fault location, summarizes the procedure of circuit test and fault location. Finally the digital circuit diagnosis system which can locate the fault on the pin of components is designed. With the help of probe, fault location of component pins can be accurately pinpointed.

Su Wei Zhang Shide Xue Lijun

Beijing Union University

国际会议

International Conference on Intelligent Computation Technology and Automation(2008 智能计算技术与自动化国际会议 ICICTA 2008)

长沙

英文

2188-2191

2008-10-20(万方平台首次上网日期,不代表论文的发表时间)