Indentation size effect in microhardness measurements of Hg1-zMnzTe
The effect of surface damaged layer and Te enrichment layer of Hg1-xMnxTe on the indentation size were studied experimentally. Based on the results, the indentation size effect (ISE) of Hg1-xMnxTe were discussed using different models, including Meyers law, the power-law, Hays-Kendall approach and the theory of strain gradient plasticity. The results show that surface damaged layer weakens ISE of the wafers, but the Te enrichment layer reinforces it. The minimum test load necessary to initiate plastic deformation for different Hg1-xMnxTe wafers increases from 3.11 to 4.41 g with the increase of x from 0.05 to 0.11.The extrapolated surface hardness values of Hg1-xMnxTe are 347.21, 374.75, 378.28 and 391.51 MPa and the corresponding shear strength values are 694.53, 749.50,756.56 and 783.12 MPa for Hg1-xMnxTe with the x values of 0.05,0.07,0.09 and 0.11, respectively.
Hg1-zMnzTe indentation size effect microhardness
WANG Ze-wen JIE Wan-qi WANG Xiao-qin
School of Materials Science and Engineering, Xian University of Technology, Xian 710048, China Sch School of Materials Science and Engineering,Northwestern Polytechnical University,Xian 710072, Chin College of Chemistry and Chemical Engineering, Shaanxi University of Science and Technology,Xian 71
国际会议
2009 Frontier Symposium of China Postductors on Materrials Science(2009年中国博士后材料科学前言论坛)
长沙
英文
762-766
2009-11-22（万方平台首次上网日期，不代表论文的发表时间）