SEU MITIGATION-Using 1/3 Rate Convolution Coding

摘要：

With the new emerging fabrication technology there has been scaling of components size, leading to reduction in the physical size of devices. This increases the frequency of radiation induced temporary faults also called soft errors, which corrupts the content of the memory system. This paper proposes a new technique to protect the data from these soft errors which occurs in form of bit flips in the memory. The technique introduced is based on simple convolution codes and is proven to give good performance.

关键词： Single Event Upset (SEU) Error Detection And Correction coding (EDAC) First in First out FIFO Bit Error Rate (BER)

作者: Aabhas Rastogi Manu Agarawal Bhawna Gupta

作者单位: Electronics & communications JIIT University, 321, Sector-37, Noida, India Electronics & communications JIIT University, A-10, Sector-62, Noida, India

会议类型: 国际会议

会议名称: 2009 2nd IEEE International Conference on Computer Science and Information Technology(第二届计算机科学与信息技术国际会议 ICCSIT2009)

会议地点: 北京

会议语种:英文

页码: 1496-1499

在线出版日期: 2009-08-08（万方平台首次上网日期，不代表论文的发表时间）