The 1st Workshop on Testing Technologies and Tools for Critical Industry Applications Improving Test Quality by a Test Type Analysis Based Method

摘要：

This paper describes an easy adapted method of improving test coverage and effectiveness in an ongoing industrial project by introducing and applying test type into test case design and execution. It presents comparison results of the number of systeM test item, effectiveness of test cases, and defect detection percentage between two increments in a real-world telecom project. It argues the importance of carrying out a test type analysis approach for test design, and proved a better test effectiveness (improved 5%) and DDP(improved 14%) can be performed by implementing the proposed approach. There was only a slightly increase of the budget after adapting the approach.

关键词： Test analysis method Test Type Test effectiveness DDP

作者: Qin Liu Wenqiang Zheng JunFei Ma

作者单位: School of Software Engineering Tongji University Shanghai, China Alcatel-Lucent Shanghai, China IBM Shanghai,China

会议类型: 国际会议

会议名称: 2009 Third IEEE International Conference on Secure Integration and Reliability Improvement SSIRI 2009(第三届IEEE安全软件集成及可信性改进国际会议)

会议地点: 上海

会议语种:英文

页码: 325-328

在线出版日期: 2009-07-08（万方平台首次上网日期，不代表论文的发表时间）