The 1st Workshop on Testing Technologies and Tools for Critical Industry Applications Automatic Test Data Generation for C Programs

摘要：

Preparation of test data that adequately tests a given piece of code is very expensive and effort intensive. This paper presents a toolAutoGen that reduces this cost and effort by automatically generating test data for C code. AutoGen takes the c code and a criterion such as statement coverage, decision coverage, or Modified Condition/Decision Coverage (MCDC) and generates non-redundant test data that satisfies the specified criterion. This paper also presents our experience in using this tool to generate MCDC test data for three embedded reactive system applications. The effort required using the tool was one third of the manual effort required. The main contributions of this paper are a tool that can generate data for various kinds of coverage including MCDC and the experience of running this tool on real applications.

作者: Prasad Bokil Priyanka Darke Ulka Shrotri R. Venkatesh

作者单位: TRDDC

会议类型: 国际会议

会议名称: 2009 Third IEEE International Conference on Secure Integration and Reliability Improvement SSIRI 2009(第三届IEEE安全软件集成及可信性改进国际会议)

会议地点: 上海

会议语种:英文

页码: 359-368

在线出版日期: 2009-07-08（万方平台首次上网日期，不代表论文的发表时间）