Multi-Objective Genetic Test Generation for Systems-On-Chip Hardware Verification

摘要：

Efficient test generation is necessary for high quality hardware design verification. We present a test generation method employing genetic evolutionary algorithms, and multi-objective optimising strategies that achieve Pareto optimality. We demonstrate that the generated tests enable high coverage for the design under test and use low computational resources.

关键词： multi-objective optimisation hardware design verification

作者: Adriel Cheng Cheng-Chew Lim

作者单位: School of Electrical and Electronic Engineering, The University of Adelaide, Australia 5005

会议类型: 国际会议

会议名称: The First World Congress on Global Optimization in Engineering & Science(第一届工程与科学全局优化国际会议 WCGO2009)

会议地点: 长沙

会议语种:英文

页码: 1-7

在线出版日期: 2009-06-01（万方平台首次上网日期，不代表论文的发表时间）