SOC of Measuring the Sub-pizel Edge of Linear CCD Based on Wavelet Transform

摘要：

In order to compute the width of defects in plastic film accurately,is presented in this paper a new image fusion method is proposed. This approach firstly determines the image edge positions based on canny criteria and in combination with wavelet transform algorithm. Then use the wavelet transform algorithm to devide the images edge location in subpixel level,thus detecting the sub-pixel edge. This method which is more accurate than former single straight line fitting method can enhance edge and remove noise effectively,and experiments of one-dimension image show that this method is correct and effective.

关键词： Wavelet transform Edge detection Image fusion Sub-pizel

作者: Guo-sheng Xu

作者单位: Weifang university,Weifang 261061,China

会议类型: 国际会议

会议名称: 2009 International Conference on Information,Electronic and Computer Science(2009 国际信息、电子与计算机工程学术会议)

会议地点: 青岛

会议语种:英文

页码: 672-675

在线出版日期: 2009-11-21（万方平台首次上网日期，不代表论文的发表时间）