High Resolution, Near-Field Scanning Probe Acoustic Microscopy with Low Frequency and its Applications to Ferroelectrics and Other Related Materials
Low-frequency (below 100 kHz, even down to several kHz) near-field scanning probe acoustic microscopy (SPAM) was successfully developed based on the commercial atomic force microscope, providing a subsurface depth profile information and as well as nanoscale spatial resolution up to several run. SPAM was successfully used to image locally domain configurations of ferroelectric materials and subsurface structures of other materials (like amorphous films, etc.) Ferroelectric domain structures and the buried structures were clearly visualized by scanning probe acoustic microscopy. The acoustic imaging origin is discussed in terms of interaction between the excited acoustic wave and local structures beneath the SPAM tip. It is expected that the scanning probe acoustic microscopy in application to ferroelectrics and other materials undoubtedly enrich our understanding the nature of ferroelectricity and elasticity at submicro-, even nano-meter scale.
near-field acoustic microscopy AFM ferroelectric domain
Qingrui Yin Huarong Zeng Jiangtao Zeng Kunyu Zhao Guorong Li
Key Laboratory of Functional Ceramics and Integrated Devices, Shanghai Institute of Ceramics,Chinese Academy of Sciences, 1295 Dingxi Road, Shanghai 200050, China
国际会议
2nd China-Korea Ioint Workshop on Ultrasonic Nondestructive Evaluation(第二届中韩双边超声无损评估学术会议)
上海
英文
17-25
2009-10-20（万方平台首次上网日期，不代表论文的发表时间）