A LUT-based VRC Model For Random Logic Function Evolution

摘要：

Recently,the VRC (Virtual Reconfigurable Cir cuit) has become a mainstream solution for EHW (Evolvable Hardware) research.In this paper,A LUT-based VRC model is proposed,which can be applied for random logic function evolution.Different kinds of LUTs with appropriate intercon nections were studied on a FPGA-based platform.Research were also performed in this platform to compare with the cur rent VRC model such as VRC1 (SinMan) and VRC2 (Sekanina). The results show that 3-input LUT with a direct inter connection achieves about 8% improvement in fitness value after 20,000 generations,and obtains obvious progress in logic resource utilization rate.

关键词： EHW VRC LUT-based VRC Genetic Algorithm

作者: Haixiang Bu Liguang Chen Jinmei Lai

作者单位: Microelectronies Depart,Fudan University 825 Zhangheng Rd,Shanghai,China,201203 Microelectronics Depart,Fudan University 825 Zhangheng Rd,Shanghai,China,201203 Microeleetronics Depart,Fudan University 825 Zhangheng d,Shanghai,China,201203

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 117-121

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）