A Built-In Self-Test High-Current LED Driver

摘要：

In this paper,a built-in self-test (BIST) high current light-emitting-diode (LED) driver circuit is proposed. The circuit not only maintains different constant currents for multiple LED strings,but it also minimizes the conduction power dissipation by keeping the power MOSFETs in the constant-current controllers operating in the linear region. The proposed driver first acquires the current-voltage (I-V) data of the constant-current power MOSFETs and stores them into memories. These stored I-V data,along with a duty cycle control of the switching converter,are used to ensure that these power MOSFETs are operating in their linear region to minimize conduction power dissipation. The proposed circuit was verified using PSPICE with two to five LED strings. Simulation results show a maximum efficiency of 95.6%.

关键词： LED driver Built-in Self-Test

作者: Do Hung Nguyen Jaber Hasan Simon S.Ang

作者单位: Department of Electrical Engineering,University of Arkansas,Fayetteville,Arkansas,72701,USA

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 340-343

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）