Output Test Compression for Compound Defect Diagnosis

摘要：

In modern scan architecture,it is often desired to compact the output response without jeopardizing the diagnostic resolution.In this work,we propose an output masking scheme to meet such a stringent requirement.We consider a practical scenario in which an output compactor is in use.We aim to support the harshest condition called compound defect diagnosis,in which faults exist in both the scan chain and the core logic. To overcome the loss of the diagnostic resolution,we incorporate a split-masking scheme,by which one can easily separate the output responses of the faulty chains from those of the fault-free ones. The experimental results demonstrate that the proposed scheme can recover the diagnostic resolution loss induced by an output compactor almost completely without sacrificing the compaction ratio.

关键词： Scan Test Compound Defect Diagnosis Output Masking Scheme Test Compression

作者: Chao-Wen Tzeng Shi-Yu Huang

作者单位: Department of Electrical Engineering,National Tsing-Hua University,Hsinchu 30013,Taiwan

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 569-572

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）