F-Scan:An Approach to Functional RTL Scan for Assignment Decision Diagrams

摘要：

This paper presents a new methodology for functional Register Transfer Level (RTL) scan, in which existing functional elements and paths can be maximally utilized. The approach is called F-scan,which primarily aims to reduce the total area overhead due to augmentation for testing.Since the method allows for parallel scanning of test vectors,test application time is also made to be at the minimum. The case study shows the effectiveness of our approach compared to full scan design.

关键词： Scan design design-for-testability functional RTL assignment decision diagram

作者: Marie Engelene J.Obien Hideo Fujiwara

作者单位: Computer Design and Test Laboratory of the Graduate School of Information Science in Nara Institute of Science and Technology,Kansai Science City,630-0192 Japan

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 589-592

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）