Signature-Based Testing for Adaptive Digitally Calibrated Pipelined Analog-to-Digital Converters
This paper presents a new methodology for testing the adaptive digitally-calibrated pipelined aDCs.By the using the uncalibrated output codes,the health of the ADC under test can be reliably examined.We propose using the error signature which is obtained by integrating the absolute difference between the uncalibrated and exact output codes as a response to applying an on-chip generated test stimulus.In contrast with the existing approaches,our method has three achievements.First,it avoids the margin degradation masking that might be caused by the adaptive calibration engine,and hence our test results are more reliable.Second,it relaxes the need for highly sophisticated ATEs and requires shorter test time. Third,the results can be efficiently used for device binning. The method is scalable and can be applied to low as well as high resolutions ADCs. The results demonstrate the effectiveness of our method.
Testing for pipelined ADCs error signature test quality test cost
Mohamed Abbas Yasuo Furukawa Satoshi Komatsu Kunihiro Asada
VLSI Design & Education Center,The University of Tokyo,Tokyo 113-0032,Japan ADVANTEST Corporation,Gunma 370-0718,Japan
国际会议
2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)
长沙
英文
597-600
2009-10-20（万方平台首次上网日期，不代表论文的发表时间）