On VLSI Statistical Timing Analysis and Optimization

摘要：

Performance variation has become an in creasingly critical design objective as VLSI technology scales into the nanometer domain wherein parametric variations are inevitably significant. This paper presents an overview of statistical timing analysis in a new perspective,including clarification of problem formulation,an iterative refinement methodology,and iterative signal integrity effects aware statistical timing analysis methods. This paper also demonstrates that statistical physical design optimization does not produce noticeably different results than traditional physical design, and performance variation tolerance needs to be achieved by other techniques,e.g.,asynchronous circuit design.

关键词： VLSI Statistical Timing Analysis Physical Design

作者: Bao Liu

作者单位: Department of Electrical and Computer Engineering,University of Texas at San Antonio,San Antonio,TX 78249-0669

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 718-721

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）