Random Walk Algorithm for Large Thermal RC Network Analysis

摘要：

The heat diffusion model of IC chip is equivalent to electrical resistors and capacitors (RC) network. Instead of using direct methods to solve the network equations, a novel statistical method based on random walk techniques was proposed for thermal RC network analysis in this paper. The corresponding 2 dimension temperature distribution was derived finally.Experimental results show the simulation results are accurate enough to satisfy the error margin and the proposed method is much faster than the general method for large scale network analysis.

关键词： Integrated circuit thermal model simulation random walk

作者: Jun Guo Sheqin Dang Satoshi Goto

作者单位: Northwest University,China.He is now with the Department of Computer,Tsinghua University,Beijing 100 Department of Computer,Tsinghua University,Beijing 100084,China Graduate School of Information,Production and Systems,Waseda University,Kitakyushu 808-0135,Japan

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 771-774

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）