A Novel Dual SCR Device for ESD Protection

摘要：

This paper presents a novel dual SCR (dSCR) device for electrostatic discharge (ESD) protection. Comparing with the conventional dSCR structures,the new device is more suitable for low-voltage integrated circuit ESD protection applications since it just possesses a proper trigger voltage and holding voltage.

关键词： dual SCR(dSCR) electrostatic discharge (ESD) CMOS

作者: Yu Bo Wang Yuan Jia Song Zhang Ganggang

作者单位: Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking Universi Key Laboratory of Microeleetronic Devices and Circuits,Institute of Microelectronics,Peking Universi Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking Universi Key Laboratory of Mieroelectronie Devices and Circuits,Institute of Microelectronies,Peking Universi

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 789-791

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）