An Ezperimental Eztracted Model for Latchup Analysis in CMOS Process

摘要：

The latchup phenomenon is analyzed theoretically. A practical analytical model derived from Ebers-Moll formulations is proposed to analyze,simulate,and predict latchup,with favorable legitimacy and flexibility. The model parameters are extracted on 0.25um CMOS process from experiments. The extracted model can predict latchup successfully in circuit level when applied in SPICE.

关键词： latchup Coupled BJT model Ebers-Moll model thyristor power MOSFET switching converter

作者: Ye Li Xiaohan Gong Weiwei Xu Zhiliang Hong Dirk Killat

作者单位: State Key Laboratory of ASIC and System,Fudan University,Shanghai,PRC Dialog Semiconductor,Kirehheim-Tech,Germany

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 1035-1038

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）