Novel TSC CMOS Circuit

摘要：

Totally self-checking (TSC) circuit is a class of circuits which are used to detect faults concurrently with normal operation. This paper introduces a new method for designing self-checking static CMOS circuit. The designed circuit based on the proposed method can detect breaks and transistor stuck-on faults. The resulting circuit produces a valid code (00 or 11) on its output in the fault-free. Otherwise, this circuit produces an invalid code (01 or 10) on their outputs in the presence of such faults. The validity and effectiveness are verified through the HSPICE simulation.

关键词： Testing Self-Checking Circuit CMOS Circuit Design-for-Test Reliability

作者: Jeong Beom Km

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 1225-1227

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）