Variation RLC Model of Interconnect Based on Weibull Distribution

摘要：

Based on Weibull Distribution,a statistical RLC model considering process variations for the efficient analysis interconnect delay is proposed The statistical RLC model can be used for optimizations,like placement,interconnect synthesis and static timing analysis (STA). Although some delay models of interconnect have been presented,like Elmore,equivalent Elmore,D2M and WED,some of them have not considered the effects of inductances and every one of them have not considered the process variations. The model proposed in this paper has considered all of them. The effectiveness of the proposed model is proved through experimental results.Compared with HSPICE,the result show that the error of 50% delay is less than 1%,the error of mean and the error of the average deviation in Monte Carlo analysis are less than 1%.

关键词： Process variations RLC interconnect delay Statistical model Weibull distribution

作者: Li Jianwei Yang Yintang Dong Gang Wang Zeng

作者单位: Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,Microe Xidian University,Xian 710071,China

会议类型: 国际会议

会议名称: 2009 IEEE 8th International Conference on ASIC(第八届IEEE国际专用集成电路大会)

会议地点: 长沙

会议语种:英文

页码: 1240-1243

在线出版日期: 2009-10-20（万方平台首次上网日期，不代表论文的发表时间）