Intrinsic Microwave Dielectric Loss of Lanthanum Aluminate
The intrinsic dielectric properties of LaAlO3 were investigated in order to understand the microwave properties for several material containing LaAlO3. LaAlO3 single crystal was the prepared by Czochralski method. The temperature dependence of the dielectric properties and neutron inelastic scattering of the single crystal were measured. From these data, the intrinsic dielectric properties were evaluated and it was found that the dielectric loss of the LaAlO3 includes two types of dielectric loss. One is phonon absorption related loss and the other is the loss arising from Debye type orientation polarization. The latter affects the room temperature dielectric loss in LaAlO3 containing materials. The present study suggested that removing this polarization loss is important to decrease the total dielectric loss.
T. Shimada K. Ichikawa T. Minemura H. Yamauchi W. Utsumi Y. Ishii J. Breeze Neil McN Alford
New Business Development Center,Hitachi Metals LTD.,2-15-17 Egawa,Shimamoto,Osaka 618-0013,JAPAN Quantum Beam Science Directorate,Japan Atomic Energy Agency,Tokai Ibaraki 319-1195,JAPAN International Nuclear Technology Cooperation Center,Radiation Application Development Association,To Department of Materials,Imperial College London,Exhibition Road,London SW7 2AZ,UK
国际会议
西安
英文
250-254
2009-08-23（万方平台首次上网日期，不代表论文的发表时间）