PREPARATION OF K3Li2Nb5O15 THIN FILMS
The c-axis oriented K3Li2Nb5O15 (KLN) tungsten-bronze thin films have been grown on LaNiO3/Si substrates by RF planar magnetron sputtering. The target used in this study is prepared by sintering pressed powder with potassium and lithium enriched composition, 33mole% K2CO3, 22mole% Li2CO3 and 45 mole% Nb2O5. The optimum sputtering conditions for growing tungsten-bronze structure films are an Ar atmosphere, 1.5Pa, 100W RF power and 400℃ substrate temperature. Dielectric properties of KLN films are as follows: Curie temperature of 465℃ and the dielectric constant of 91 at room temperature.
Masatoshi Adachi Y. Aoyama Tomoaki Karaki Lihui Yang Genshui WANG Xianlin DONG
Department of Intelligent Systems Design Engineering,Faculty of Engineering,Toyama Prefectural Unive Shanghai Institute of Ceramics,Chinese Academy of Sciences 1295 Dingxi Road,Shanghai 200050,China
国际会议
西安
英文
367-369
2009-08-23(万方平台首次上网日期,不代表论文的发表时间)