Method for Lower Computation of Testability Analysis for Analog Circuit

摘要：

A efficient approach to simplify the process of linearly combination matrix of testability matrix is presented to efficiently partition ambiguity group and canonical ambiguity group in low-testability analog circuits. The approach presented uses only a single QR factorization technique and fewer matrix computations applied to the testability matrix. Then testable components and all ambiguity groups and canonical ambiguity group can be obtained from equivalent binary matrix that has the same size as linear combination matrix. At last an experiment of Band-pass Filter Circuit is presented to demonstrate the effectives of the proposed algorithm.

关键词： testability matriz ambiguity group equivalent binary matriz

作者: Yong Lei Yongle Xie Guangju Chen

作者单位: Automation Engineering School,University of Electronic Science and Technology of China,ChengDu,SiChuan,610054

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 69-71

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）