Implementation of Hierarchical Design for Testability Methodology

摘要：

A comprehensive test strategy initiated as early into the design cycle as possible can yield significant improvement in test coverage,faster fault diagnosis,lowered test and development costs,shorter system development time,and faster time to market. One means of improving the testability of systems is to adopt a structured,hierarchical design methodology,and a corresponding hierarchical test methodology. This paper would introduce the implementation of hierarchical design for testability (DFT) methodology from three ways: hierarchical structure,hierarchical test buses based on M1L-STD1553B,IEEE 1149.5,and IEEE1149.1,and concurrent test engineering.

关键词： DFT testability hierarchical design concurrent test engineering.

作者: Zhang Yansheng Chen Jianhui Jin Jianhui

作者单位: Mechanical Engineering College ShiJiaZhuang 050003,HeBei Province,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 369-373

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）